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Jan 23, 2026
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EEE 6319 Metrology and Characterization of Electronic Materials Credit Hours: 3
The course provides an overview of important characterization techniques commonly used for the analysis of electronic materials. It covers the fundamental operating principles, and spectroscopy data interpretation for quantitative and qualitative analysis.
Prerequisite(s): None Corequisite(s): None Co-Prerequisite(s): None
USF College of Engineering | Department of Electrical Engineering
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